Focus on rfideas vulnerabilities and metrics.
Last updated: 08 Mar 2025, 23:25 UTC
This page consolidates all known Common Vulnerabilities and Exposures (CVEs) associated with rfideas. We track both calendar-based metrics (using fixed periods) and rolling metrics (using gliding windows) to give you a comprehensive view of security trends and risk evolution. Use these insights to assess risk and plan your patching strategy.
For a broader perspective on cybersecurity threats, explore the comprehensive list of CVEs by vendor and product. Stay updated on critical vulnerabilities affecting major software and hardware providers.
Total rfideas CVEs: 1
Earliest CVE date: 16 Sep 2024, 07:15 UTC
Latest CVE date: 16 Sep 2024, 07:15 UTC
Latest CVE reference: CVE-2024-1578
30-day Count (Rolling): 0
365-day Count (Rolling): 1
Calendar-based Variation
Calendar-based Variation compares a fixed calendar period (e.g., this month versus the same month last year), while Rolling Growth Rate uses a continuous window (e.g., last 30 days versus the previous 30 days) to capture trends independent of calendar boundaries.
Month Variation (Calendar): 0%
Year Variation (Calendar): 0%
Month Growth Rate (30-day Rolling): 0.0%
Year Growth Rate (365-day Rolling): 0.0%
Average CVSS: 0.0
Max CVSS: 0
Critical CVEs (≥9): 0
Range | Count |
---|---|
0.0-3.9 | 1 |
4.0-6.9 | 0 |
7.0-8.9 | 0 |
9.0-10.0 | 0 |
These are the five CVEs with the highest CVSS scores for rfideas, sorted by severity first and recency.
The MiCard PLUS Ci and MiCard PLUS BLE reader products developed by rf IDEAS and rebranded by NT-ware have a firmware fault that may result in characters randomly being dropped from some ID card reads, which would result in the wrong ID card number being assigned during ID card self-registration and might result in failed login attempts for end-users. Random characters being dropped from ID card numbers compromises the uniqueness of ID cards that can, therefore, result in a security issue if the users are using the ‘ID card self-registration’ function.